Reference: Siede W and Eckardt-Schupp F (1986) A mismatch repair-based model can explain some features of u.v. mutagenesis in yeast. Mutagenesis 1(6):471-4

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Abstract


Our studies on the REV2-dependent processes of DNA repair and u.v. mutagenesis in yeast are summarized and compared with the general features of DNA damage-induced mutagenesis in yeast. On the basis of the data available, we propose that mismatch repair is an essential process in u.v. mutagenesis. We assume that a photoproduct site in double-stranded DNA can be handled as a replicative mismatch leading to misinsertion opposite the lesion.

Reference Type
Journal Article | Review
Authors
Siede W, Eckardt-Schupp F
Review For
RAD5